Dual-Tip Scanning Electron Microscope

Model: LMF02
Manufacturer: home-built
Technical Specifications：

• Maximum vacuum: 1E-4Pa
• SEM magnification: > 20,000 times
• Resolution: 5 nm
• Probe movement accuracy: 50 nm
• Measuring temperature: room temperature - 500 °C
• Spectrum range of light source: 200-2500 nm
• Maximum light intensity: 700 mW/cm2

Features and Applications：

It is an important and effective tool for studying quantum behavior of materials and devices in low-dimensional and small-scale environments. By introducing nano-probes into scanning electron microscopy, local physical properties of low-dimensional nanostructures and micro/nano-devices can be measured. Moreover, physical properties at edge temperature can be studied and intrinsic properties of nanostructures and devices can be explored. For example, it can be used to measure the field emission characteristics of one-dimensional nanomaterials at different positions, transport and mechanical properties of various nanostructures, and nano-manipulation.